Resistance of electronics to aggressive environments
Автор: Ryzhkova E.A., Lozhkin N.D.
Журнал: Международный журнал гуманитарных и естественных наук @intjournal
Рубрика: Технические науки
Статья в выпуске: 1-3 (100), 2025 года.
Бесплатный доступ
The evolutionary development of microprocessor architecture depends on the changing aspects of technology development, with increasing crystal density and increasing memory speed. With the growth of software requirements under conditions of high and low temperatures, radiation, chemically active substances, mechanical loads and electromagnetic interference, architecture compromises require deeper analysis, taking into account the impact of reducing technological standards, the possibilities of developing solutions for aggressive environments, etc. The scientific article considers such design solutions for protecting microprocessors, including an analysis of the use of SOI technologies.
Microprocessors, aggressive environments, radiation resistance, thermal stabilization, protective coatings, fault tolerance, asynchronous circuits
Короткий адрес: https://sciup.org/170208735
IDR: 170208735 | DOI: 10.24412/2500-1000-2025-1-3-216-219