An estimation of geometry factor influence of edxrf spectra taking into account multiple scattering

The current mathematical models of taking into account of influence of geometry factor on signal to background ratio are considered in case of real EDXRF spectrometers. The model of multiple scattering based on electron and photon radiation transport in elements of spectrometer using the Monte Carlo method is proposed. It is shown that taking into account multiple scattering lead to better agreement between experimental and calculated data.