Patterns and Predictors of Student Technological Proficiency in Heis: A Validated Instrument and Machine Learning Analysis
Автор: Abdelilah Chahid, Youssef El Marzak, Ossama Aouane, Khalifa Mansouri
Журнал: International Journal of Modern Education and Computer Science @ijmecs
Статья в выпуске: 3 vol.18, 2026 года.
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This study examines AI-related technological proficiency among undergraduate students at the University of Casablanca and identifies the most informative indicators for prediction. Using a validated 30-item instrument covering AI applications, AI-related skills, and improvement strategies, data were collected from 600 students drawn from science and humanities programs. Overall proficiency was moderate: 63.3% of respondents met the predefined threshold, and significant group differences were observed by gender and academic specialization. For predictive modeling, correlation-based feature selection retained 17 high-value items. Two classifiers were then trained and evaluated using a 75/25 hold-out split, complemented by repeated stratified 10-fold cross-validation to assess stability. The Support Vector Classifier achieved 96.7% test accuracy with AUROC = 0.9666, while Gaussian Naïve Bayes reached 94.7% accuracy with AUROC = 0.9560; cross-validated estimates remained consistent with these results, supporting robustness. These findings indicate that a reduced set of questionnaire items can provide reliable estimates of students’ AI-related technological proficiency and can support scalable assessment and targeted interventions in higher education.
Digital Competence, AI Literacy, Machine Learning, Higher Education, Feature Selection, Support Vector Classifier, Gaussian Naïve Bayes
Короткий адрес: https://sciup.org/15020358
IDR: 15020358 | DOI: 10.5815/ijmecs.2026.03.06