A Mono Master Shrug Matching Algorithm for Examination Surveillance
Sandhya Devi G,
Prasad Reddy P V G D,
Suvarna Kumar G,
Vijay Chaitanya B
Edge Detection System using Pulse Mode Neural Network for Image Enhancement
S.Jagadeesh Babu,
P.Karunakaran,
S.Venkatraman,
I.Hameem Shanavas,
T.Kapilachander
Data-Centric Enterprise Architecture
Zeinab Rajabi,
Maryam Nooraei Abade
Sentiment Analysis of Review Datasets Using Naïve Bayes' and K-NN Classifier
Lopamudra Dey,
Sanjay Chakraborty,
Anuraag Biswas,
Beepa Bose,
Sweta Tiwari